Photoinduced doping in graphene and
its related heterostructures
has drawn much interest as one of the possible ways to control the
electronic properties of graphene. In this paper, we report that graphene/silicon
(Gr/Si) heterostructures are an effective configuration for photoinduced
doping in graphene. Raman spectroscopy, electrical and photoelectrical
measurements are used to characterize the photoinduced doping effect.
The results demonstrate that the graphene in the Gr/Si heterostructure
is p-doped by light irradiation, and the doping effect
can be controlled by varying the irradiation time. For the electrical
properties of the Gr/Si Schottky junction, the photoinduced doping
effect reduces the barrier height and series resistance but enhances
the ideality factor. For the photovoltaic properties, the doping strengthens
the open-circuit voltage, short-circuit current, fill factor, and
conversion efficiency. The work should be helpful on developing effective
ways for graphene doping and in depth understanding and better use
of Gr/Si Schottky junctions for electronics and optoelectronics.