Near-field imaging in the microwave regime has many applications from radar, to through-the-wall imaging and cancer cell detection. Currently, practical near-field imagers are implemented as bench-top systems and therefore are bulky, expensive, and typically susceptible to electromagnetic interference. Here we introduce and demonstrate the first single-chip nanophotonic near-field imager, where the impinging microwave signals are up-converted to the optical domain and then optically delayed and processed to form the near-field image of the target object. The 121-element imager, which is integrated on a silicon chip, is capable of simultaneous processing of ultra-wideband microwave signals and achieves ±40 mrad spatial resolution for near-field imaging with orders of magnitude smaller volume than the bench-top implementations and fraction of the power consumption.
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