6369940.pdf (1.96 MB)
Supplementary document for Broadband transverse unidirectional scattering and large range nanoscale displacement measuring based on the interaction between tightly focused azimuthally polarized beam and silicon hollow nanostructure - 6369940.pdf
Version 2 2023-04-25, 00:02
Version 1 2023-04-25, 00:01
journal contribution
posted on 2023-04-25, 00:02 authored by zhaokun zhang, yuqi xiang, wei xu, Chucai Guo, Ken Liu, Zhu Hongmultipole decomposition and influence of substrate
