Categorization and SEU Fault Simulations of RHBD-FF.xlsx (27.63 kB)
Data for RHBD-FF.xlsx
This is the simulation data of 6 Radiation Hardened by Design Flip-Flops + Conventional Transmission Gate Flip-Flop (TGFF).
This data contains (for each FF):
1.No of transistors
2. Qcritical at all corners
3. Static power at all corners
4. Dynamic power at all corners and different clock frequencies (100MHz, 250MHz, 500MHz, 1GHz, and 2GHz)
5. Different timing at all corners
Funding
This research received no external funding.
History
Usage metrics
Keywords
Licence
Exports
RefWorksRefWorks
BibTeXBibTeX
Ref. managerRef. manager
EndnoteEndnote
DataCiteDataCite
NLMNLM
DCDC