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oe-17-3-1352-m002.AVI (1.98 MB)

Media 2: Simultaneous measurement method of total and self-interference for the volumetric thickness-profilometer

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posted on 2009-02-02, 00:00 authored by Jang-Woo You, Daesuk Kim, Sung Yoon Ryu, Soohyun Kim
Originally published in Optics Express on 02 February 2009 (oe-17-3-1352)

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    Optics Express

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    measurement methodmediaoeOptics Express02 February 2009self-interferencethickness-profilometer

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