oe-11-8-952-m001.MOV (2.27 MB)

Media 1: Wide band interferometry for thickness measurement

media

posted on 2003-04-21, 00:00 authored by Santiago Costantino, Oscar E. Martínez, Jorge R. Torga

Originally published in Optics Express on 21 April 2003 (oe-11-8-952)

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Wide media oe Optics Express 21 April 2003 thickness measurement interferometry

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