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MSE values of the training and testing of the 2-input dataset for the TCAD-labeled ASMT algorithm.

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posted on 2019-08-13, 17:35 authored by Parag Parashar, Chun Han Chen, Chandni Akbar, Sze Ming Fu, Tejender S. Rawat, Sparsh Pratik, Rajat Butola, Shih Han Chen, Albert S. Lin

MSE values of the training and testing of the 2-input dataset for the TCAD-labeled ASMT algorithm.

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    predictionTCAD modelsMSENNASMTBOSCHmethodaccuracysemiconductor manufacturingtraininganalytics-statisticML

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