posted on 2018-04-12, 00:00authored byVinayaraj Ozhukil Kollath, Ying Liang, Francis D. Mayer, Xinyou Ma, Carol Korzeniewski, Kunal Karan
Orientational ordering within nanoscale
(70–8 nm) thickness
fluorinated ionomer films on Si substrates was investigated through
the use of attenuated total reflection Fourier transform infrared
(ATR–FTIR) spectroscopy in conjunction with electromagnetic
field calculations. A spectral model was developed for Nafion thin
films across the 1400–950 cm–1 region from
frequency-dependent, isotropic optical constants derived from Kramers–Kronig
analysis of ionomer transmission infrared spectra. The model considered
infrared light propagation within the parallel boundary regions between
the Ge ATR crystal, the ionomer film, and the Si substrate supporting
the film. The calculations reproduced overall polymer thickness-dependent
changes in peak frequencies and band shapes observed in experimental
spectra recorded with p- and s-polarized light. General trends were
traceable to effects of anomalous dispersion and electric field enhancement
within the nanoscale gap separating the Ge and Si phases. However,
optical effects could not fully explain perturbations in spectra of
the thinnest films, where molecular orientational ordering is expected
to be strongest. Strategies for gleaning further molecular structural
detail from vibrational spectra of ultrathin (<50 nm) ionomer films
are discussed.