posted on 2025-08-08, 05:29authored byXiangyang Li, Tangguo Liu, Lin Chen, Xingyou Tian
During stretching, lamellar stacks
within semicrystalline polymers
are often oriented and deformed, resulting in diverse and complex
two-dimensional small-angle X-ray scattering (2D-SAXS) patterns. Accurately
interpreting the information behind 2D-SAXS has been challenging.
An effective method to extract the information is to list all possible
deformations and determine corresponding SAXS patterns, identifying
useful methods to characterize the deformed lamellar stack from their
relationship. However, no such work has been carried out due to lack
of suitable tools. In this study, we investigated the factors affecting
the determination of 2D-SAXS using two-dimensional fast Fourier transform
(2DFFT) and classical scattering equation. Results indicate that the
sampling rate and the dimensions of the digital matrix are two critical
factors affecting 2D-SAXS. Besides, different from the classical scattering
equation, what is determined by fast Fourier transform is the average
intensity over a period. Based on the above discussions, a straightforward
method to simulate 2D-SAXS of oriented structures using 2DFFT was
proposed and applied to a high-temperature annealed isotactic polypropylene
(iPP) sample. It was found that the eyebrow-like scattering pattern
could be caused by inhomogeneous lateral contraction forces during
stretching of iPP. The method sheds light on the deformation mechanisms
in semicrystalline polymers.