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Supplemental Materials: Structural Properties and Recrystallization Effects in Ion Beam Modified B20-type FeGe Films

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posted on 2025-01-13, 05:05 authored by Jiangteng Liu, Ryan Schoell, Xiyue Zhang, Hongbin Yang, Michael Venuti, Hanjong Paik, David A. Muller, Tzu-Ming Lu, Khalid Hattar, Serena Eley
Electron diffraction data on pristine FeGe thin films

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    APL Materials

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    FeGeskyrmionsrecrystallization kineticsselect area electron diffraction

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