XRD data of ZnO-nanostructure

 X-ray diffraction   (XRD) was used to determine the crystalline structure and grain sizes of the synthesized ZnO NPs. The intensity data were recorded over a 2θ range of 10−60^o. The strongest diffraction peaks observed at 2θ values of 31.92°, 34.62°, 36.44°, 47.74°, and 56.76° have been indexed as (100), (002), (101), (110) and (103) crystal planes of ZnO, respectively.