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Raw PXRD Patterns and Rietveld Refinement Profiles of Hot-Pressed GSST Samples

Version 2 2025-09-30, 12:46
Version 1 2025-09-01, 08:41
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posted on 2025-09-30, 12:46 authored by Cheng-Ruei WuCheng-Ruei Wu, Yun‐Han Huang Lu, Hsin-Jay Wu, Chien-Neng Liao
<p dir="ltr">This dataset contains the raw PXRD patterns of all hot-pressed GSST samples, covering the full scan range along with relevant metadata to ensure transparency and reproducibility. The corresponding Rietveld refinement profiles are also included, demonstrating the quality of the fits and supporting the structural analysis reported in the main manuscript.</p>

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National Science and Technology Council

the Ministry of Education (MOE) in Taiwan

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