G002_SupplementaryData

Name: G002_SupplementaryData
Published: 2023-08-29T02:49:03+00:00
License: https://creativecommons.org/licenses/by/4.0/
Keywords: Robust statistics, Control limits, Attributes, Defectives

dataset

posted on 2023-08-29, 02:49 authored by Sufinah DahariSufinah Dahari

Dataset and statistical analysis for the paper "Robust Control Chart Application in Semiconductor Manufacturing Process" submitted to ICoAIMS 2023: 4th International Conference on Applied & Industrial Mathematics and Statistics 2023.

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Robust statistics Control limits Attributes Defectives

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CC BY 4.0

G002_SupplementaryData

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