## X-ray data-collection and refinement statistics for NcImpα/SV40NLS structure.

2015-06-19T03:47:37Z (GMT) by

R

merge

=

hkl

(

i

(

I

hkl,i

<

I

hkl

>))

hkl,i

<

I

hkl

>

, where Ii (hkl) is the intensity of an individual measurement of the reflection with Miller indices hkl and hI(hkl)i is the mean intensity of this reflection. Calculated for I > -3σ (I) [21].

R

cryst

=

hkl

(Fob

s

hkl

Fcal

c

hkl

)

Fob

s

hkl

, where ∣Fobs∣ and ∣Fcalc∣ are the observed and calculated structure-factor amplitudes, respectively.

§ Rfree is equivalent to Rcryst but was calculated with reflections (5%) omitted from the refinement process. Calculated based on the Luzzati plot with the program SFCHECK [31].

† † Calculated with the program PROCHECK [31].

aValues in parentheses are for the highest-resolution shell.

X-ray data-collection and refinement statistics for NcImpα/SV40NLS structure.

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