TOF-SIMS depth profiling analysis of the SMA strain of <i>Saccharomyces pastorianus</i> grown in the non-fermentative glycerol-containing YPG media for 24 h, 48 h and 72 h.

<p>The negative atomic ions C<sup>-</sup>, NH<sup>-</sup>, O<sup>-</sup>, OH<sup>-</sup>, P<sup>-</sup> and S<sup>-</sup> were monitored. The intensities were normalized at each sputtering time and are expressed as % relative amounts.</p>