pone.0200552.g006.tif (739.73 kB)
TOF-SIMS depth profiling analysis of the SMA strain of Saccharomyces pastorianus grown in the non-fermentative glycerol-containing YPG media for 24 h, 48 h and 72 h.
figure
posted on 2018-07-11, 17:50 authored by Greg Potter, Chantel W. Swart, Pieter W. J. van Wyk, Mart-Mari Duvenhage, Elizabeth Coetsee, Hendrik C. Swart, Suzanne M. Budge, R. Alex SpeersThe negative atomic ions C-, NH-, O-, OH-, P- and S- were monitored. The intensities were normalized at each sputtering time and are expressed as % relative amounts.
