TOF-SIMS depth profiling analysis of the SMA strain of <i>Saccharomyces pastorianus</i> grown in the fermentative glucose-containing YM media for 24 h, 48 h and 72 h.
2018-07-11T17:50:42Z (GMT) by
<p>The negative atomic ions C<sup>-</sup>, NH<sup>-</sup>, O<sup>-</sup>, OH<sup>-</sup>, P<sup>-</sup> and S<sup>-</sup> were monitored. The intensities were normalized at each sputtering time and are expressed as % relative intensity.</p>
CC BY 4.0