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Supporting information for Quantification and optimization of STEM image contrast for beam sensitive materials

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journal contribution
posted on 2018-04-23, 10:39 authored by Karthikeyan Gnanasekaran, Gijsbertus de With, Heiner Friedrich
Quantification-SI-Gnanasekaran

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    Royal Society Open Science

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    Keywords

    scanning transmission electron microscopyMonte Carlo simulationsimage contrastbeam-sensitive materialslow-contrast materialselectron dose

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    CC BY 4.0

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