Demonstration of polycrystalline thin film coatings on glass for spin Seebeck energy harvesting - dataset

<div>Zip file with all raw XRD, XRR, transport data.</div>Origin project(s) containing raw and processed data for related publication.<div><br></div><div>Figure 1 was schematic only and not included here.</div><div>Figure 2 and Figure S2 are in the same origin project (simple and extended TEM data).</div><div><br></div><div>Figure captions:</div><div><p></p><p>Figure 2 TEM analysis of SSE5a. a) & b) STEM/BF and HAADF images of the thin film, respectively. c) Conventional HREM of the PM Pt layer. d) EDX line-scan performed perpendicular to the interfaces of the layers.</p><p></p><p>Figure 3 Summary of the magnetic, electric and thermal properties. a) Spin Seebeck voltage, <i>V<sub>ISHE</sub></i> (symbols), as a function of applied magnetic field plotted alongside magnetic data (line). b) Resistivity of the devices as a function of <i>t<sub>PM</sub></i>. c) Normalised spin Seebeck voltage, <i>S<sub>SSE</sub></i>, as a function of <i>t<sub>PM</sub></i>, plotted alongside simulated <i>S<sub>SSE</sub></i> (<i>θ<sub>SH</sub></i> = 0.1, <i>λ<sub>SD</sub></i> = 2 nm, <i>M<sub>s</sub></i> = 90 Am<sup>2</sup>/kg, D = 71x10<sup>41</sup> Jm<sup>2</sup>[19], <i>g<sub>r</sub></i> = 1,3 & 5x10<sup>18</sup> m<sup>-2</sup>[20]). d) Definition of the parameters used to describe heat flow, (e) & (f) Change in <i>ΔT<sub>2</sub></i>, and <i>S<sub>SSE</sub></i> with substrate's thermal conductivity, <i>κ<sub>3</sub></i>.</p><p>Figure S1 Characterisation of the Fe<sub>3</sub>O<sub>4</sub> film. a) SQUID magnetometry above and below the Verwey transition, <i>T<sub>V</sub></i>. b) Resistivity as a function of temperature. c) XRD of a set of 4 separately prepared Fe<sub>3</sub>O<sub>4</sub> films. The inset shows a close-up of the (311), (222) peaks. d) Example XRR data (symbols) and fit (solid line), indicating thickness = 79 nm, roughness = 1.5 nm.</p><p></p><p>Figure S2 TEM analysis of SSE5a. a) & b) STEM/BF and HAADF images of the thin film, respectively. c) Conventional HREM of the PM Pt layer. d) & e) STEM/BF image of the thin film stack and corresponding EDX line-scan performed perpendicular to the interfaces of the layers, respectively, and f) schematic of the grain growth described in the text.</p><p></p><p>Figure S3 Characteristics of the bilayer film. a) XRD of SSE5a (2.5 nm Pt) and SSE20a (7.3 nm Pt). Inset shows a close-up of the Pt peak. b)  XRR fit of SSE5a; Pt thickness = 2.5 nm, roughness = 2 nm.</p><p></p><p>Figure S4 Example spin Seebeck measurement for SSE7a (<i>t<sub>PM</sub></i> = 3.2 nm) measured in fixed field as a function of temperature difference. Note that the sign convention for measurements, defined in Fig 1(a) of the main manuscript follows from Uchida <i>et al.</i>[6].</p></div>