ao-55-29-8368-d001.CSV (1.62 kB)
Data File 1: Determination of optical constants including surface characteristics of optically thick nanostructured Ti films: analyzed by spectroscopic ellipsometry
dataset
posted on 2016-10-10, 00:00 authored by Jyoti Jaiswal, Satyendra Mourya, Gaurav Malik, Samta Chauhan, Amit Sanger, Ritu Daipuriya, Manpreet Singh, Ramesh ChandraCorrelation values between the surface roughness, thickness & volume fraction of oxide/Ti EMA layer and Drude & Lorentz coefficients for the sample T1~100 nm. Originally published in Applied Optics on 10 October 2016 (ao-55-29-8368)
