Data File 1: Determination of optical constants including surface characteristics of optically thick nanostructured Ti films: analyzed by spectroscopic ellipsometry

Correlation values between the surface roughness, thickness & volume fraction of oxide/Ti EMA layer and Drude & Lorentz coefficients for the sample T1~100 nm. Originally published in Applied Optics on 10 October 2016 (ao-55-29-8368)