3366206.pdf
Christopher Stevens
Tineke Stroucken
Andreas Stier
jagannath Paul
Haoxiang Zhang
Prasenjit Dey
Scott Crooker
Stephan Koch
Denis Karaiskaj
10.6084/m9.figshare.6262058.v2
https://opticapublishing.figshare.com/articles/journal_contribution/3366206_pdf/6262058
The supplementary material contains all the atomic force microscopy (AFM) measurements, thickness measurements, and all the transmission, reflection, and Absorption spectra for both materials (experiment and theory).
2018-06-08 15:52:22
Supplemental material