3366206.pdf Christopher Stevens Tineke Stroucken Andreas Stier jagannath Paul Haoxiang Zhang Prasenjit Dey Scott Crooker Stephan Koch Denis Karaiskaj 10.6084/m9.figshare.6262058.v2 https://opticapublishing.figshare.com/articles/journal_contribution/3366206_pdf/6262058 The supplementary material contains all the atomic force microscopy (AFM) measurements, thickness measurements, and all the transmission, reflection, and Absorption spectra for both materials (experiment and theory). 2018-06-08 15:52:22 Supplemental material