Engineering, Altmetric Lightfoot, Amy Konkiel, Stacy Introduction to Altmetric’s newest data source, patent citations <p>Tracking patent citations to research is an important way to understand how the knowledge is commercialized.</p><p>Altmetric now indexes patents from nine jurisdictions worldwide, including World Intellectual Property Organization, United States Patent and Trademark Office, and the European Patent Office.</p><p><br></p><p>Watch this webinar to learn how to find, visualize, read, and export patent citations using Altmetric products.</p> altmetrics;Altmetric;Altmetric Explorer for Institutions;patents;knowledge commercialization;Research, Science and Technology Policy 2018-04-24
    https://altmetric.figshare.com/articles/media/Introduction_to_Altmetric_s_newest_data_source_patent_citations/6179063
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