Media 1: Wide band interferometry for thickness measurement Santiago Costantino Oscar E. Martínez Jorge R. Torga 10.1364/OE.11.000952.m001 https://opticapublishing.figshare.com/articles/media/Media_1_Wide_band_interferometry_for_thickness_measurement/4931285 Originally published in Optics Express on 21 April 2003 (oe-11-8-952) 2003-04-21 00:00:00 Wide media oe Optics Express 21 April 2003 thickness measurement interferometry