Media 1: Wide band interferometry for thickness measurement
Santiago Costantino
Oscar E. MartÃnez
Jorge R. Torga
10.1364/OE.11.000952.m001
https://opticapublishing.figshare.com/articles/media/Media_1_Wide_band_interferometry_for_thickness_measurement/4931285
Originally published in Optics Express on 21 April 2003 (oe-11-8-952)
2003-04-21 00:00:00
Wide
media
oe
Optics Express
21 April 2003
thickness measurement
interferometry