TY - DATA T1 - Data File 1: Determination of optical constants including surface characteristics of optically thick nanostructured Ti films: analyzed by spectroscopic ellipsometry PY - 2016/10/10 AU - Jyoti Jaiswal AU - Satyendra Mourya AU - Gaurav Malik AU - Samta Chauhan AU - Amit Sanger AU - Ritu Daipuriya AU - Manpreet Singh AU - Ramesh Chandra UR - https://opticapublishing.figshare.com/articles/dataset/Data_File_1_Determination_of_optical_constants_including_surface_characteristics_of_optically_thick_nanostructured_Ti_films_analyzed_by_spectroscopic_ellipsometry/4930097 DO - 10.1364/AO.55.008368.d001 L4 - https://ndownloader.figshare.com/files/8297774 KW - constant KW - surface roughness KW - sample KW - surface characteristics KW - EMA KW - thickness KW - Lorentz coefficients KW - nm KW - ao KW - 10 October 2016 KW - Determination KW - Applied Optics KW - spectroscopic ellipsometry Correlation values KW - volume fraction KW - data KW - oxide KW - nanostructured Ti films KW - Drude N2 - Correlation values between the surface roughness, thickness & volume fraction of oxide/Ti EMA layer and Drude & Lorentz coefficients for the sample T1~100 nm. Originally published in Applied Optics on 10 October 2016 (ao-55-29-8368) ER -