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Version 2 2018-06-08, 15:52
Version 1 2018-06-06, 19:56
journal contribution
posted on 2018-06-08, 15:52 authored by Christopher Stevens, Tineke Stroucken, Andreas Stier, jagannath Paul, Haoxiang Zhang, Prasenjit Dey, Scott Crooker, Stephan Koch, Denis Karaiskaj
The supplementary material contains all the atomic force microscopy (AFM) measurements, thickness measurements, and all the transmission, reflection, and Absorption spectra for both materials (experiment and theory).

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