Silicon Oxide: A Non-innocent Surface for Molecular Electronics and Nanoelectronics Studies
Jun Yao
Lin Zhong
Douglas Natelson
James M. Tour
10.1021/ja108277r.s001
https://acs.figshare.com/articles/journal_contribution/Silicon_Oxide_A_Non_innocent_Surface_for_Molecular_Electronics_and_Nanoelectronics_Studies/2695375
Silicon oxide (SiO<sub><i>x</i></sub>) has been widely used in many electronic systems as a supportive and insulating medium. Here, we demonstrate various electrical phenomena such as resistive switching and related nonlinear conduction, current hysteresis, and negative differential resistance intrinsic to a thin layer of SiO<sub><i>x</i></sub>. These behaviors can largely mimic numerous electrical phenomena observed in molecules and other nanomaterials, suggesting that substantial caution should be paid when studying conduction in electronic systems with SiO<sub><i>x</i></sub> as a component. The actual electrical phenomena can be the result of conduction from SiO<sub><i>x</i></sub> at a post soft-breakdown state and not the presumed molecular or nanomaterial component. These electrical properties and the underlying mechanisms are discussed in detail.
2011-02-02 00:00:00
SiOx
phenomena
nanomaterial component
Nanoelectronics StudiesSilicon oxide
Molecular Electronics
silicon Oxide
nonlinear conduction