Subnanometer
Vacancy Defects Introduced on Graphene
by Oxygen Gas
Yasuhiro Yamada
Kazumasa Murota
Ryo Fujita
Jungpil Kim
Ayuko Watanabe
Masashi Nakamura
Satoshi Sato
Kenji Hata
Peter Ercius
Jim Ciston
Cheng
Yu Song
Kwanpyo Kim
William Regan
Will Gannett
Alex Zettl
10.1021/ja4117268.s001
https://acs.figshare.com/articles/journal_contribution/Subnanometer_Vacancy_Defects_Introduced_on_Graphene_by_Oxygen_Gas/2323447
The basal plane of graphene has been
known to be less reactive
than the edges, but some studies observed vacancies in the basal plane
after reaction with oxygen gas. Observation of these vacancies has
typically been limited to nanometer-scale resolution using microscopic
techniques. This work demonstrates the introduction and observation
of subnanometer vacancies in the basal plane of graphene by heat treatment
in a flow of oxygen gas at low temperature such as 533 K or lower.
High-resolution transmission electron microscopy was used to directly
observe vacancy structures, which were compared with image simulations.
These proposed structures contain CO, pyran-like ether, and
lactone-like groups.
2014-02-12 00:00:00
basal plane
vacancy
oxygen gas
Oxygen GasThe basal plane
Subnanometer Vacancy Defects
graphene