Lee, Sang Hoon Lee, Tae Il Lee, Su Jeong Lee, Sang Myung Yun, Ilgu Myoung, Jae Min Electrical Characteristics of Metal Catalyst-Assisted Etched Rough Silicon Nanowire Depending on the Diameter Size The dependence of electrical properties of rough and cylindrical Si nanowires (NWs) synthesized by diameter-controllable metal catalyst-assisted etching (MCE) on the size of the NW’s diameter was demonstrated. Using a decal-printing and transfer process assisted by Al<sub>2</sub>O<sub>3</sub> sacrificial layer, the Si NW field effect transistor (FET) embedded in a polyvinylphenol adhesive and dielectric layer were fabricated. As the diameter of Si NW increased, the mobility of FET increased from 80.51 to 170.95 cm<sup>2</sup>/V·s and the threshold voltage moved from −7.17 to 0 V because phonon–electron wave function overlaps, surface scattering, and defect scattering decreased and gate coupling increased as the ratio of surface-to-volume got reduced. diameter;Silicon Nanowire;Si nanowires;transfer process;dielectric layer;Diameter SizeThe dependence;Electrical Characteristics;FET;0 V;Al 2O;Si NW;MCE;Si NW field effect transistor;threshold voltage 2015-01-14
    https://acs.figshare.com/articles/journal_contribution/Electrical_Characteristics_of_Metal_Catalyst_Assisted_Etched_Rough_Silicon_Nanowire_Depending_on_the_Diameter_Size/2216005
10.1021/am507478q.s001