Deng, Xinwei Jin, Ran QQ Models: Joint Modeling for Quantitative and Qualitative Quality Responses in Manufacturing Systems <p>A manufacturing system with both quantitative and qualitative (QQ) quality responses (as a QQ system) is widely encountered in many cases. For example, in a lapping process of the semiconductor manufacturing, the quality of wafer’s geometrical characteristics is often measured by the total thickness variation as a quantitative response and the conformity of site total indicator reading as a binary qualitative response. The QQ responses are closely associated with each other in a QQ system, but current methodologies often model the two types of quality responses separately. This article presents a novel modeling approach, called “QQ models,” to jointly model the QQ responses through a constrained likelihood estimation. The QQ models can jointly select significant predictors by incorporating inherent features of QQ systems, leading to accurate variable selection and prediction. Both simulation studies and a case study in a lapping process are used to evaluate the performance of the proposed method. Supplementary materials to this article are available online.</p> QQ responses;QQ system;novel modeling approach;Qualitative Quality Responses;quality responses 2015-10-08
    https://tandf.figshare.com/articles/journal_contribution/QQ_Models_Joint_Modeling_for_Quantitative_and_Qualitative_Quality_Responses_in_Manufacturing_Systems/1384850
10.6084/m9.figshare.1384850